1986 Photomicrography Competition
![Small World](/images/SW50-logo.png)
![](https://www.nikonsmallworld.com/images/photos/1986/_photo800/1986_11.jpg)
11th Place
Etched-enhanced stacking faults in silicon wafer surface
Gordon P. Lee
- Affiliation
- University of Hawaii
Physical Electronics Laboratory
Honolulu, Hawaii, USA
- Technique
- Differential Interference Contrast
- Magnifaction
- 50