Structured Illumination Microscopy
Structured Illumination Microscopy (SIM) is a super-resolution fluorescence optical microscope imaging technique that increases resolution by exploiting interference patterns (moiré patterns) created when two grids are overlaid at an angle. Suitable for both fixed and live cell imaging, SIM effectively doubles the resolution of traditional light microscopy and is of great value in structural, developmental, and intracellular communication studies.
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